Image Based Metrology for Nanoscale Self-assembly Processes
Robust registration of 2d and 3d point sets. Image and Vision ... Unsupervised texture segmentation using gabor filters. Pattern Recognition ... [10] P. D. Kovesi. Matlab and octave functions for computer vision and image processing, 2000.
| Title | : | Image Based Metrology for Nanoscale Self-assembly Processes |
| Author | : | Prabu Ravindran |
| Publisher | : | - 2007 |
You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.
Once you have finished the sign-up process, you will be redirected to your download Book page.
How it works:- 1. Register a free 1 month Trial Account.
- 2. Download as many books as you like (Personal use)
- 3. Cancel the membership at any time if not satisfied.
